WebMA6500 Specification. Function. Replace IQC Visual Inspection on Surface Defects (Including particles, scratches, etc.) Auto-storing Wafer Surface Defects Image and Position Coordinate Records. Wafer. Compatible with 8-inch and 12-inch Wafer. Wafer Thickness:300um ~ 2000um. Wafer Handling. Support Automatic Opening Function for … Web不平度检测,non-flatness measurement 1)non-flatness measurement不平度检测 1.A novel in-situ non-flatness measurement method of wafer chuck in step-and-scan projection lithographic tool is presented.提出一种步进扫描投影光刻机承片台不平度检测新技术。 2)parallelism detection平行度检测
PROCEDURE FOR INSTALLING ALL MAGNETIC CHUCKS
WebSuperior chuck flatness ... ERS chillers can provide chuck temperatures down to -65 °C at an impressively small footprint unmatched by other thermal wafer chuck systems. The patented AC² technology also allows … WebNew sensor design insensitive to wafer/chuck flatness. Rapidity of even full wafer mapping measurements ensures an impressive throughput and the ability to monitor and control the epitaxial process Improved new software has multiple benefits, such as: highly configurable, multitasking, real-time data monitoring, simplified recipe generation ... how to remove difficult stains from clothes
Wafer Probing - ERS electronic GmbH
WebMay 6, 2024 · They will typically have flatness specifications that range from ±4 µm to ± 8µm. It is standard practice for the chuck to be customised to the application, and so there are a great many types of chuck available to the operator when configuring their probe station. Examples include: Thermal chucks; Double sided chucks; High frequency ... Web1. Place the chuck, face down, on the sliding table of the surface grinder and indicate the surface of the chuck length wise and cross wise. Shim as necessary to level the surface … WebThe flatness external adjustment device group 220 for the chuck is composed of a flatness external adjustment device for a plurality of chucks that are evenly disposed and … how to remove difficult ear wax